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Research in Harsh Environment MEMSTechnology Development
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![]() Fig.1: Piezoresistive pressure sensor with RIE etched 3-C SiC piezoresistors on SOI substrate. ![]() Fig. 3: Single crystal 3-C SiC deposited on Unibond substrates (200nm Si overlayer, 400 nm thick buried oxide layer, deposition using methylsilane at 1220°C). |
![]() Fig.2: 3-C-SiC on SOI based micro hotplate for micro gas sensor applications (max. 650°C / 1000°C). ![]() Fig.4: TEM micrograph of SiC/SOI amorphisation of SiC by ion implantation of Si, 500 keV, 1E15 cm², 3.5 MeV, 1E16 cm²;deffraction patterns indicate amorphous and crystalline regions. |
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